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Application of high-resolution X-ray diffractornetry to the structural study of epitaxial multilayers on novel index surfaces
A. Sanz-Hervás, M. Garrido, M. Aguilar, A. Sacedón, J.L. Sánchez-Rojas, E. Calleja, E. Muñoz, C. Villar, E.J. Abril, M. LópezVolume:
28
Year:
1997
Language:
english
Pages:
8
DOI:
10.1016/s0026-2692(96)00116-4
File:
PDF, 489 KB
english, 1997