Optimum design in a JFET for minimum...

Microelectronics Reliability 2000 Vol. 40; Iss. 11

Optimum design in a JFET for minimum generation–recombination noise

A Godoy, J.A Jiménez-Tejada, A Palma, J.E Carceller
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Volume:
40
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(00)00084-6
File:
PDF, 136 KB
english, 2000
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