A method to minimize test time for accelerated ageing of...

Microelectronics Reliability 2000 Vol. 40; Iss. 8-10

A method to minimize test time for accelerated ageing of pHEMT's by analysis of the electronic fingerprint of the initial stage of degradation

R. Petersen, W. De Ceuninck, L. De Schepper, J.-L. Muraro
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Volume:
40
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(00)00111-6
File:
PDF, 390 KB
english, 2000
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