Reliability and stability of GaAs-based pseudomorphic...

Microelectronics Reliability 2000 Vol. 40; Iss. 8-10

Reliability and stability of GaAs-based pseudomorphic quantum wells for high-precision power metering

Y. Haddab, V. Mossee, F. Kobbi, R. Pond
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Volume:
40
Year:
2000
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(00)00134-7
File:
PDF, 389 KB
english, 2000
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