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Transconductance increase due to charge trapping during hot-carrier stress of nMOSFETs
J.M. Rafí, F. CampabadalVolume:
40
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(00)00173-6
File:
PDF, 498 KB
english, 2000