Evaluation of the hot carrier/ionizing radiation induced...

Evaluation of the hot carrier/ionizing radiation induced effects on the RF characteristics of low-complexity SiGe heterojunction bipolar transistors by numerical simulation

J Kuchenbecker, M Borgarino, A Coustou, R Plana, J Graffeuil, F Fantini
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Volume:
40
Year:
2000
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(00)00175-x
File:
PDF, 463 KB
english, 2000
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