Reliability aspects of high temperature power MOSFETs

Microelectronics Reliability 2000 Vol. 40; Iss. 8-10

Reliability aspects of high temperature power MOSFETs

J.V. Manca, W. Wondrak, W. Schaper, K. Croes, J.D Haen, W. De Ceuninck, B. Dieval, H.L. Hartnagel, M. D'Olieslaeger, L. De Schepper
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Volume:
40
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(00)00187-6
File:
PDF, 345 KB
english, 2000
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