Reliability physics of compound semiconductor transistors for microwave applications
M Borgarino, R Menozzi, D Dieci, L Cattani, F FantiniVolume:
41
Year:
2001
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(00)00206-7
File:
PDF, 209 KB
english, 2001