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Reliability physics of compound semiconductor transistors...

Reliability physics of compound semiconductor transistors for microwave applications

M Borgarino, R Menozzi, D Dieci, L Cattani, F Fantini
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Volume:
41
Year:
2001
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(00)00206-7
File:
PDF, 209 KB
english, 2001
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