Low-frequency noise of thick-film resistors as quality and...

Microelectronics Reliability 2001 Vol. 41; Iss. 4

Low-frequency noise of thick-film resistors as quality and reliability indicator

Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova
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Volume:
41
Year:
2001
Language:
english
Pages:
12
DOI:
10.1016/s0026-2714(00)00255-9
File:
PDF, 1.07 MB
english, 2001
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