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Optimal Reliability Design: Fundamentals and Applications; Way Kuo, Rajendra Prasad, Frank A. Tillman, Ching-Lai Mwang. Cambridge University Press, Cambridge, 2001, 389+XXI pp. ISBN: 0-521-78127-2 (hardbound)
Milan JevtićVolume:
41
Year:
2001
Language:
english
Pages:
2
DOI:
10.1016/s0026-2714(01)00018-x
File:
PDF, 35 KB
english, 2001