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High field stress at and above room temperature in 2.3 nm thick oxides
D. Zander, C. Petit, F. Saigne, A. MeinertzhagenVolume:
41
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(01)00062-2
File:
PDF, 241 KB
english, 2001