Reliability of ultrathin nitrided oxides grown in low...

Reliability of ultrathin nitrided oxides grown in low pressure N2O ambient

M. Beichele, A.J. Bauer, H. Ryssel
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Volume:
41
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(01)00071-3
File:
PDF, 260 KB
english, 2001
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