Degradation of thin oxides during electrical stress

Microelectronics Reliability 2001 Vol. 41; Iss. 12

Degradation of thin oxides during electrical stress

Gennadi Bersuker, Yongjoo Jeon, Howard R Huff
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Volume:
41
Year:
2001
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(01)00120-2
File:
PDF, 411 KB
english, 2001
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