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Creation and thermal annealing of interface states induced by uniform or localized injection in 2.3nm thick oxides.
D. Zander, F. Saigné, A. MeinertzhagenVolume:
41
Year:
2001
Pages:
6
DOI:
10.1016/s0026-2714(01)00140-8
File:
PDF, 389 KB
2001