Backside Localization of Current Leakage Faults Using...

Microelectronics Reliability 2001 Vol. 41; Iss. 9-10

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation

R. Desplats, F. Beaudoin, P. Perdu, P. Poirier, D. Tremouilles, M. Bafleur, D. Lewis
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Volume:
41
Year:
2001
Pages:
6
DOI:
10.1016/s0026-2714(01)00167-6
File:
PDF, 604 KB
2001
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