Determination of the thermal resistance and current...

Microelectronics Reliability 2001 Vol. 41; Iss. 9-10

Determination of the thermal resistance and current exponent of heterojunction bipolar transistors for reliability evaluation

R. Petersen, W. De Ceuninck, L. De Schepper, O. Vendier, H. Blanck, D. Pons
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Volume:
41
Year:
2001
Pages:
6
DOI:
10.1016/s0026-2714(01)00195-0
File:
PDF, 305 KB
2001
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