Construction of a cost-effective failure analysis service...

Microelectronics Reliability 2002 Vol. 42; Iss. 4-5

Construction of a cost-effective failure analysis service network––microelectronic failure analysis service in Japan

S Nakajima, S Nakamura, K Kuji, T Ueki, T Ajioka, T Sakai
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Volume:
42
Year:
2002
Language:
english
Pages:
11
DOI:
10.1016/s0026-2714(02)00043-4
File:
PDF, 765 KB
english, 2002
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