Experimental and simulation analysis of a BCD ESD...

Microelectronics Reliability 2002 Vol. 42; Iss. 9-11

Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions

M. Blaho, D. Pogany, L. Zullino, A. Andreini, E. Gornik
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Volume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00135-x
File:
PDF, 1.30 MB
2002
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