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Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
R. Petersen, W. De Ceuninck, J. D’Haen, M. D’Olieslager, L. De Schepper, O. Vendier, H. Blanck, D. PonsVolume:
42
Year:
2002
Pages:
5
DOI:
10.1016/s0026-2714(02)00149-x
File:
PDF, 634 KB
2002