Series resistance degradation due to NBTI in PMOSFET

Microelectronics Reliability 2002 Vol. 42; Iss. 9-11

Series resistance degradation due to NBTI in PMOSFET

Mahesh S. Krishnan, Viktor Kol’dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li
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Volume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00164-6
File:
PDF, 737 KB
2002
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