Simulative prediction of the resistance change due to...

Simulative prediction of the resistance change due to electromigration induced void evolution

Hajdin Ceric, Siegfried Selberherr
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Volume:
42
Year:
2002
Pages:
4
DOI:
10.1016/s0026-2714(02)00169-5
File:
PDF, 758 KB
2002
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