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Electrical characteristics of high-energy proton irradiated ultra-thin gate oxides
J.M. Rafı́, B. Vergnet, F. Campabadal, C. Fleta, L. Fonseca, M. Lozano, C. Martı́nez, M. UllánVolume:
42
Year:
2002
Pages:
4
DOI:
10.1016/s0026-2714(02)00178-6
File:
PDF, 665 KB
2002