Reliability analysis of power MOSFET’s with the help of...

Microelectronics Reliability 2002 Vol. 42; Iss. 9-11

Reliability analysis of power MOSFET’s with the help of compact models and circuit simulation

A. Castellazzi, R. Kraus, N. Seliger, D. Schmitt-Landsiedel
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Volume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00198-1
File:
PDF, 821 KB
2002
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