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Reliability of power transistors against application driven temperature swings
Sudha Gopalan, Benno Krabbenborg, Jan-Hein Egbers, Bart van Velzen, Rene ZinggVolume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00201-9
File:
PDF, 2.42 MB
2002