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A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors
M. Ciappa, F. Carbognani, P. Cova, W. FichtnerVolume:
42
Year:
2002
Pages:
6
DOI:
10.1016/s0026-2714(02)00206-8
File:
PDF, 1.27 MB
2002