Magnetic field measurements for Non Destructive Failure...

Microelectronics Reliability 2002 Vol. 42; Iss. 9-11

Magnetic field measurements for Non Destructive Failure Analysis

O. Crépel, C. Goupil, B. Domengès, P. Descamps, P. Perdu, A. Doukkali
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Volume:
42
Year:
2002
Pages:
4
DOI:
10.1016/s0026-2714(02)00227-5
File:
PDF, 696 KB
2002
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