Effects of burn-in stressing on post-irradiation annealing...

Microelectronics Reliability 2003 Vol. 43; Iss. 9-11

Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs

S. Djoric-Veljkovic, I. Manic, V. Davidovic, S. Golubovic, N. Stojadinovic
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Volume:
43
Year:
2003
Pages:
6
DOI:
10.1016/s0026-2714(03)00258-0
File:
PDF, 916 KB
2003
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