![](/img/cover-not-exists.png)
A new method for the analysis of high-resolution SILC data
S. Aresu, W. De Ceuninck, G. Knuyt, J. Mertens, J. Manca, L. De Schepper, R. Degraeve, B. Kaczer, M. D’Olieslaeger, J. D’HaenVolume:
43
Year:
2003
Pages:
6
DOI:
10.1016/s0026-2714(03)00263-4
File:
PDF, 492 KB
2003