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Degradation in polysilicon thin film transistors related to the quality of the polysilicon material
H. Toutah, B. Tala-Ighil, J.F. Llibre, B. Boudart, T. Mohammed-Brahim, O. BonnaudVolume:
43
Year:
2003
Pages:
5
DOI:
10.1016/s0026-2714(03)00271-3
File:
PDF, 951 KB
2003