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High reliability level demonstrated on 980nm laser diode
J. Van de Casteele, D. Laffitte, G. Gelly, C. Starck, M. BettiatiVolume:
43
Year:
2003
Pages:
4
DOI:
10.1016/s0026-2714(03)00292-0
File:
PDF, 776 KB
2003