Robustness improvement of VDMOS transistors in...

Microelectronics Reliability 2003 Vol. 43; Iss. 9-11

Robustness improvement of VDMOS transistors in Bipolar/CMOS/DMOS technology

Y. Rey-Tauriac, O. de Sagazan, M. Taurin, O. Bonnaud
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Volume:
43
Year:
2003
Pages:
5
DOI:
10.1016/s0026-2714(03)00317-2
File:
PDF, 854 KB
2003
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