1/f noise analysis of InP/InGaAs DHBTs submitted to bias...

Microelectronics Reliability 2003 Vol. 43; Iss. 9-11

1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses

J.C. Martin, C. Maneux, N. Labat, A. Touboul, M. Riet, S. Blayac, M. Kahn, J. Godin
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Volume:
43
Year:
2003
Pages:
6
DOI:
10.1016/s0026-2714(03)00340-8
File:
PDF, 1.20 MB
2003
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