Power-constrained testing for bridging and stuck short...

Microelectronics Reliability 1997 Vol. 37; Iss. 5

Power-constrained testing for bridging and stuck short faults in CMOS combinational circuits

Asad A. Ismaeel, Rakesh Bhatnagar
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Volume:
37
Year:
1997
Language:
english
Pages:
9
DOI:
10.1016/s0026-2714(96)00060-1
File:
PDF, 526 KB
english, 1997
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