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Low frequency noise characterization of 0.18μm Si CMOS transistors
T. Boutchacha, G. Ghibaudo, G. Guégan, T. SkotnickiVolume:
37
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(97)00119-4
File:
PDF, 253 KB
english, 1997