Comments on the utilization of noise measurements for the...

Comments on the utilization of noise measurements for the characterization of electromigration in metal lines

C. Ciofi, V. Dattilo, B. Neri
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Volume:
37
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(97)00121-2
File:
PDF, 309 KB
english, 1997
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