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Characterisation of degradation mechanisms in resonant tunnelling diodes
A. Vogt, M. Brandt, A. Sigurdardottir, M. Schüssler, D. Peña, A. Simon, H.L. Hartnagel, M. Rodewald, M. Roesner, H. Fuess, S.N.N. Goswami, K. LalVolume:
37
Year:
1997
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(97)00141-8
File:
PDF, 309 KB
english, 1997