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Thermomechanical failures in microelectronic interconnects
J.W. Evans, J.Y. Evans, P. Lall, S.L. CornfordVolume:
38
Year:
1998
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(97)00226-6
File:
PDF, 421 KB
english, 1998