Analysis of high temperature effects on performances and...

Microelectronics Reliability 1999 Vol. 39; Iss. 1

Analysis of high temperature effects on performances and hot-carrier degradation in DC/AC stressed 0.35 μm n-MOSFETs

A. Bravaix, D. Goguenheim, N. Revil, E. Vincent, M. Varrot, P. Mortini
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Volume:
39
Year:
1999
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(98)00166-8
File:
PDF, 401 KB
english, 1999
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