Temperature acceleration of breakdown and quasi-breakdown...

Microelectronics Reliability 1999 Vol. 39; Iss. 6-7

Temperature acceleration of breakdown and quasi-breakdown phenomena in ultra-thin oxides

S. Bruyère, D. Roy, E. Vincent, G. Ghibaudo
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Volume:
39
Year:
1999
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(99)00106-7
File:
PDF, 361 KB
english, 1999
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