Advanced failure detection techniques in deep submicron...

Microelectronics Reliability 1999 Vol. 39; Iss. 6-7

Advanced failure detection techniques in deep submicron CMOS integrated circuits

Antonio Rubio, Josep Altet, Diego Mateo
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Volume:
39
Year:
1999
Language:
english
Pages:
10
DOI:
10.1016/s0026-2714(99)00122-5
File:
PDF, 768 KB
english, 1999
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