Relation between defect generation, stress induced leakage...

Microelectronics Reliability 2000 Vol. 40; Iss. 4-5

Relation between defect generation, stress induced leakage current and soft breakdown in thin (

R Rodrı́guez, E Miranda, R Pau, J Suñé, M Nafrı́a, X Aymerich
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Volume:
40
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(99)00278-4
File:
PDF, 153 KB
english, 2000
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