Cell array structure test in EEPROM reliability assessment...

Cell array structure test in EEPROM reliability assessment at an early process development stage

F Pio, E Gomiero
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Volume:
40
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(99)00286-3
File:
PDF, 324 KB
english, 2000
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