Study of the positive charge buildup into buried oxide of SIMOX SOI structure during bias–temperature stress
I Barchuk, V Kilchytska, A NazarovVolume:
40
Year:
2000
Language:
english
Pages:
4
DOI:
10.1016/s0026-2714(99)00307-8
File:
PDF, 162 KB
english, 2000