SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials
Galizzi, Gustavo E., Coupland, Jeremy M., Ruiz, Pablo D., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870257
File:
PDF, 465 KB
english, 2010