Environmental tests of embedded thin- and thick-film resistors in comparison to chip resistors
Agata Skwarek, Dr, Steplewski, Wojciech, Dziedzic, Andrzej, Borecki, Janusz, Koziol, Grazyna, Serzysko, TomaszVolume:
40
Language:
english
Journal:
Circuit World
DOI:
10.1108/CW-10-2013-0039
Date:
January, 2014
File:
PDF, 196 KB
english, 2014