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IEEE Transactions on Electromagnetic Compatibility 2015

Method of Effective Roughness Dielectric in a PCB: Measurement and Full-Wave Simulation Verification

Koledintseva, Marina Y., Vincent, Tracey, Scogna, Antonio Ciccomancini, Hinaga, Scott
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Year:
2015
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2015.2412113
File:
PDF, 11.59 MB
english, 2015
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