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Measurement of beam quality factor (M2) by slit-scanning method
Jiaan Zheng, Shengzhi Zhao, Qingpu Wang, Xingyu Zhang, Lei ChenVolume:
33
Year:
2001
Language:
english
Pages:
5
DOI:
10.1016/s0030-3992(01)00026-3
File:
PDF, 130 KB
english, 2001