![](/img/cover-not-exists.png)
Double shearography for engineering metrology: optical and digital approach
V.M. Murukeshan, Ng Chee Keong, Krishnakumar. V, Ong Lin Seng, A. AsundiVolume:
33
Year:
2001
Language:
english
Pages:
4
DOI:
10.1016/s0030-3992(01)00029-9
File:
PDF, 250 KB
english, 2001