Measurement of the thickness and refractive indices of...

Measurement of the thickness and refractive indices of multiple layers by a confocal interference microscope using a low coherence source

Taskashi Fukano, Ichirou Yamaguchi
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
29
Year:
1997
Language:
english
Pages:
1
DOI:
10.1016/s0030-3992(97)88442-3
File:
PDF, 145 KB
english, 1997
Conversion to is in progress
Conversion to is failed