Zygo interferometer for measuring refractive index of photorefractive bismuth silicon oxide (Bi12SiO20) crystal
R.P. Shukla, D.V. Udupa, M.D. AggarwalVolume:
30
Year:
1998
Language:
english
Pages:
6
DOI:
10.1016/s0030-3992(98)00076-0
File:
PDF, 186 KB
english, 1998